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1

Rhizosphere-enhanced biosurfactant action on slowly desorbing PAHs in contaminated soil

Posada-Baquero, Rosa, JimÃ©nez-Volkerink, Sara Nienke, GarcÃa, JosÃ© Luis, Vila, Joaquim, Cantos, Manuel, Grifoll, Magdalena, Ortega-Calvo, Jose Julio

Journal:

Science of The Total Environment

Year:

2020

File:

PDF, 780 KB

2020

2

A runoff system restores the principle of minimum differentiation

Marco Haan, Bjørn Volkerink

Journal:

European Journal of Political Economy

Year:

2001

Language:

english

File:

PDF, 52 KB

english, 2001

3

Strength prediction of adhesively bonded single lap joints with the eXtended Finite Element Method

Völkerink, O., Kosmann, J., Schollerer, M. J., Holzhüter, D., Hühne, C.

Journal:

The Journal of Adhesion

Year:

2019

Language:

english

File:

PDF, 2.68 MB

english, 2019

4

Fragmented Government Effects on Fiscal Policy: New Evidence

Bjørn Volkerink and Jakob De Haan

Journal:

Year:

2001

Language:

english

File:

PDF, 1.80 MB

english, 2001

5

Mutations Affecting Export and Activity of Cytolysin A from Escherichia coli

Ludwig, A., Volkerink, G., von Rhein, C., Bauer, S., Maier, E., Bergmann, B., Goebel, W., Benz, R.

Journal:

Journal of Bacteriology

Year:

2010

Language:

english

File:

PDF, 1.03 MB

english, 2010

6

Will Ageing Lead to a Higher Real Exchange Rate for the Netherlands?

Casper van Ewijk, Maikel Volkerink

Journal:

Year:

2012

Language:

english

File:

PDF, 355 KB

english, 2012

7

Horizontal integration in the Dutch financial sector

Erik Dietzenbacher, Bert Smid, Bjørn Volkerink

Journal:

International Journal of Industrial Organization

Year:

2000

Language:

english

File:

PDF, 110 KB

english, 2000

8

[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Efficient seed utilization for reseeding based compression [logic testing]

Volkerink, E.H., Mitra, S.

Year:

2003

Language:

english

File:

PDF, 280 KB

english, 2003

9

[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - ELF-Murphy data on defects and test sets

McCluskey, E.J., Al-Yamani, A., Li, J.C.-M., Chao-Wen Tseng,, Volkerink, E., Ferhani, F.-F., Li, E., Mitra, S.

Year:

2004

Language:

english

File:

PDF, 1.34 MB

english, 2004

10

Empirical Validation of Yield Recovery Using Idle-Cycle Insertion

Donghwi Lee, Volkerink, E., Park, I., Rearick, J.

Journal:

IEEE Design & Test of Computers

Year:

2007

Language:

english

File:

PDF, 1.19 MB

english, 2007

11

[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Speed clustering of integrated circuits

Brand, K.A., Mitra, S., Volkerink, E., McCluskey, E.J.

Year:

2004

Language:

english

File:

PDF, 692 KB

english, 2004

12

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Welcome message

Press, Ron, Volkerink, Erik

Year:

2010

Language:

english

File:

PDF, 154 KB

english, 2010

13

[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Test economics for multi-site test with modern cost reduction techniques

Volkerink, E.H., Khoche, A., Rivoir, J., Hilliges, K.D.

Year:

2002

Language:

english

File:

PDF, 294 KB

english, 2002

14

Fragmented Government Effects on Fiscal Policy: New Evidence

Bjørn Volkerink, Jakob de Haan

Journal:

Year:

2001

Language:

english

File:

PDF, 110 KB

english, 2001

15

[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Test vector compression using EDA-ATE synergies

Khoche, A., Volkerink, E., Rivoir, J., Mitra, S.

Year:

2002

Language:

english

File:

PDF, 287 KB

english, 2002

16

Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits

Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus D. Hilliges

Journal:

Journal of Electronic Testing

Year:

2003

Language:

english

File:

PDF, 779 KB

english, 2003

17

[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - Atpg padding and ate vector repeat per port for reducing test data volume

Vranken, H., Hapke, F., Rogge, S., Chindamo, D., Volkerink, E.

Year:

2003

Language:

english

File:

PDF, 1007 KB

english, 2003

18

[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Tackling test trade-offs from design, manufacturing to market using economic modeling

Volkerink, E.H., Khoche, A., Kamas, L.A., Rivoir, J., Kerkhoff, H.G.

Year:

2001

Language:

english

File:

PDF, 1.20 MB

english, 2001

19

Strength prediction of adhesively bonded single lap joints with the eXtended Finite Element Method

Völkerink, O., Kosmann, J., Schollerer, M. J., Holzhüter, D., Hühne, C.

Journal:

The Journal of Adhesion

Year:

2019

File:

PDF, 2.68 MB

2019

20

[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Packet-based input test data compression techniques

Volkerink, E.H., Khoche, A., Mitra, S.

Year:

2002

Language:

english

File:

PDF, 672 KB

english, 2002

21

[ACM Press the 42nd annual conference - San Diego, California, USA (2005.06.13-2005.06.17)] Proceedings of the 42nd annual conference on Design automation - DAC '05 - Response compaction with any number of unknowns using a new LFSR architecture

Volkerink, Erik H., Mitra, Subhasish

Year:

2005

Language:

english

File:

PDF, 246 KB

english, 2005

22

Tax Ratios in Macroeconomics: Do Taxes Really Matter?

Bjørn Volkerink, Jan-Egbert Sturm, Jakob de Haan

Journal:

Year:

2002

Language:

english

File:

PDF, 509 KB

english, 2002

23

The ABCs of ITC

Press, Ron, Volkerink, Erik

Journal:

IEEE Design & Test of Computers

Year:

2010

Language:

english

File:

PDF, 103 KB

english, 2010

24

[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Delay defect screening using process monitor structures

Mitra, S., Volkerink, E., McCluskey, E.J., Eichenberger, S.

Year:

2004

File:

PDF, 4.31 MB

2004

25

[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Test chip experiments at stanford CRC

Al-Yamani, Ahmed, Chang, Jonathan, Franco, Piero, Li, James, Ma, Siyad, Mitra, Subhasish, Park, Intaik, Tseng, Chao-wen, Volkerink, Erik

Year:

2009

Language:

english

File:

PDF, 244 KB

english, 2009

26

Surface toughening – a concept to decrease stress peaks in bonded joints

Schollerer, M.J., Kosmann, J., Völkerink, O., Holzhüter, D., Hühne, C.

Journal:

The Journal of Adhesion

Year:

2018

Language:

english

File:

PDF, 3.67 MB

english, 2018

27

[IEEE 2005 42nd Design Automation Conference - Anaheim, CA, USA (2005.06.13-2005.06.17)] Proceedings. 42nd Design Automation Conference, 2005. - Response compaction with any number of unknowns using a new LFSR architecture

Volkerink, E.H., Mitra, S.

Year:

2005

Language:

english

File:

PDF, 883 KB

english, 2005

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